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Page 14 of 39                           Jeon et al. Soft Sci. 2025, 5, 1  https://dx.doi.org/10.20517/ss.2024.35





















































                Figure 5. (A) Schematic of DLP process and film formation (top) and photographs of integrated TFTs, I-V/C-F measurement of MIM
                structure, and I -V  curves of IGZO TFTs (bottom). Reproduced with  permission [72] , Copyright 2014, American Chemical Society; (B)
                          D
                            G
                Photograph of TFTs on PC substrate and transfer curves of TFTs (top) and electrical characteristics of TFTs under different bending
                conditions or cycles (bottom). Reproduced with  permission [82] , Copyright 2014, Elsevier; (C) Leakage current density-electric field of
                AlO  and ZAO dielectric, OM image of ZAO-based TFTs on ITO/PI substrate and transfer curves of TFTs with ZAO dielectric before and
                  x
                after bending test. Reproduced with  permission [141] , Copyright 2013, The Royal Society of Chemistry; (D) Schematic of synaptic In O
                                                                                                        2  3
                TFTs, Capacitance as a function of frequency for polymer electrolyte and transfer curve of synaptic In O  TFTs on PI substrate at
                                                                                       2  3
                different bending radii. Reproduced with  permission [147] , Copyright 2020, American Chemical Society; (E) Photographs of integrated
                TFTs with bending test method and transfer curves of TFTs under different bending cycles. Reproduced with permission [149] , Copyright
                2019, American Chemical Society. DLP: Direct light pattern; TFTs: thin-film transistors; MIM: metal-insulator-metal; IGZO: indium
                gallium zinc oxide; PC: polycarbonate; ZAO: zirconium doped aluminum oxide; OM: optical microscopy; ITO: indium-tin-oxide; PI:
                polyimide.
               electric double layer (EDL) forms at the interface between the semiconductor and the polymer electrolyte,
               resulting in high gate capacitance of ~0.36  µF/cm  and low gate voltage operations . Additionally,
                                                             2
                                                                                           [147]
               Samanta et al. fabricated a-IGZO flexible TFTs on a PI Kapton substrate with an electrolyte dielectric (PEO
                                                                                                      -1 -1
                                                                                                   2
               + LiClO ) and reported high-performance electrical characteristics, exhibiting a mobility of ~42 cm ·V ·s ,
                      4
               an  on/off  current  ratio  of  ~10 , a  threshold  voltage  of  0.7  V,  and  a  low  subthreshold  swing  of
                                            5
               175 mV/dec . Also, these devices also form EDL, resulting in a very high gate capacitance of ~30 µF/cm .
                                                                                                        2
                         [148]
               The study showed the stable performance of TFTs after bending test, emphasizing their valuable
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