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REFERENCES
1. Covaci C, Gontean A. Piezoelectric energy harvesting solutions: a review. Sensors 2020;20:3512. DOI PubMed PMC
2. Sezer N, Koç M. A comprehensive review on the state-of-the-art of piezoelectric energy harvesting. Nano Energy 2021;80:105567.
DOI
3. Shung KK, Cannata JM, Zhou QF. Piezoelectric materials for high frequency medical imaging applications: a review. J Electroceram
2007;19:141-7. DOI
4. Sekhar MC, Veena E, Kumar NS, Naidu KCB, Mallikarjuna A, Basha DB. A review on piezoelectric materials and their applications.
Cryst Res Technol 2023;58:2200130. DOI
5. Iqbal M, Nauman MM, Khan FU, et al. Vibration-based piezoelectric, electromagnetic, and hybrid energy harvesters for
microsystems applications: a contributed review. Int J Energy Res 2021;45:65-102. DOI
6. Li F, Lin D, Chen Z, et al. Ultrahigh piezoelectricity in ferroelectric ceramics by design. Nat Mater 2018;17:349-54. DOI
7. Li F, Cabral MJ, Xu B, et al. Giant piezoelectricity of Sm-doped Pb(Mg Nb )O -PbTiO single crystals. Science 2019;364:264-8.
3
3
1/3
2/3
DOI
8. Zhang S. High entropy design: a new pathway to promote the piezoelectricity and dielectric energy storage in perovskite oxides.
Microstructures 2022;3:2023003. DOI
9. Batson PE, Dellby N, Krivanek OL. Sub-angstrom resolution using aberration corrected electron optics. Nature 2002;418:617-20.
DOI
10. Krivanek O, Dellby N, Lupini A. Towards sub-Å electron beams. Ultramicroscopy 1999;78:1-11. DOI
11. Hetherington C. Aberration correction for TEM. Mater Today 2004;7:50-5. DOI
12. Voyles PM, Muller DA, Grazul JL, Citrin PH, Gossmann HJ. Atomic-scale imaging of individual dopant atoms and clusters in highly
n-type bulk Si. Nature 2002;416:826-9. DOI PubMed
13. Voyles PM, Grazul JL, Muller DA. Imaging individual atoms inside crystals with ADF-STEM. Ultramicroscopy 2003;96:251-73.
DOI PubMed
14. Jiang Y, Chen Z, Han Y, et al. Electron ptychography of 2D materials to deep sub-ångström resolution. Nature 2018;559:343-9. DOI
15. Liu C, Cui J, Cheng Z, et al. Direct observation of oxygen atoms taking tetrahedral interstitial sites in medium-entropy body-
centered-cubic solutions. Adv Mater 2023;35:e2209941. DOI
16. Close R, Chen Z, Shibata N, Findlay SD. Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via
differential phase contrast using electrons. Ultramicroscopy 2015;159 Pt 1:124-37. DOI PubMed
17. Krivanek OL, Lovejoy TC, Dellby N, et al. Vibrational spectroscopy in the electron microscope. Nature 2014;514:209-12. DOI
18. de la Mata M, Molina SI. STEM tools for semiconductor characterization: beyond high-resolution imaging. Nanomaterials 2022;12:337.
DOI PubMed PMC
19. Ophus C. Four-dimensional scanning transmission electron microscopy (4D-STEM): from scanning nanodiffraction to ptychography
and beyond. Microsc Microanal 2019;25:563-82. DOI PubMed
20. Lin Y, Zhou M, Tai X, Li H, Han X, Yu J. Analytical transmission electron microscopy for emerging advanced materials. Matter
2021;4:2309-39. DOI
21. Williams DB, Carter CB. Transmission electron microscopy. New York: Springer; 1996. DOI
22. Lebeau JM, Stemmer S. Experimental quantification of annular dark-field images in scanning transmission electron microscopy.
Ultramicroscopy 2008;108:1653-8. DOI PubMed
23. LeBeau JM, Findlay SD, Allen LJ, Stemmer S. Quantitative atomic resolution scanning transmission electron microscopy. Phys Rev
Lett 2008;100:206101. DOI PubMed
24. Muller DA, Nakagawa N, Ohtomo A, Grazul JL, Hwang HY. Atomic-scale imaging of nanoengineered oxygen vacancy profiles in
SrTiO . Nature 2004;430:657-61. DOI PubMed
3
25. Fitting L, Thiel S, Schmehl A, Mannhart J, Muller DA. Subtleties in ADF imaging and spatially resolved EELS: a case study of low-
angle twist boundaries in SrTiO . Ultramicroscopy 2006;106:1053-61. DOI PubMed
3