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Cabral et al. Microstructures 2023;3:2023040 https://dx.doi.org/10.20517/microstructures.2023.39 Page 13 of 17

b. Data analysis: With the advancement in S/TEM instrumentation, the alignment and probe-correction
processes have become more streamlined, allowing researchers to dedicate more time to data processing.
Whether it involves HAADF or 4D-STEM imaging, data analysis remains a critical step in extracting
meaningful information from images. To promote the widespread accessibility of advanced electron
microscopy and analysis, it is crucial to make these tools readily available to all researchers. When
publishing data, it is important to provide the associated analysis tools to ensure the repeatability of
measurements and enable further development. By making analysis tools readily available, researchers can
reproduce and validate the results obtained by their peers. Moreover, it allows for the exploration of
alternative analysis techniques and the advancement of the field. This open sharing of analysis tools fosters
collaboration, facilitates scientific progress, and maximizes the value of the obtained data.

(2) Development of 4D-STEM: Direct electron and pixelated detectors have opened new possibilities for
advanced electron microscopy. Despite significant advancements in the last decade, there are many
opportunities for additional applications. This includes the use of 4D-STEM with in-situ microscopy to
characterize dynamic processes in materials. Although the data collection process for 4D-STEM is typically
slower than with conventional detectors, the technique allows in-depth characterization of features such as
domains and strain fields. The stability of modern in-situ systems makes this a promising direction for
functional materials research.

Overall, electron microscopy holds tremendous potential for advanced characterization in the study of
ferroic and the broader category of functional materials. The continuous development of instrumentation
and data processing methods has allowed for deep insights into the characterization of advanced materials,
which are crucial for understanding the intricate relationships between structure and properties. While
there have been significant advancements in the field, it is important to recognize that there is still work to
be done. Further efforts are needed to expand the scope of characterization techniques and enhance the
accessibility of electron microscopy to researchers from diverse backgrounds. This includes developing new
imaging modalities, improving data analysis tools, and making these resources widely available. By pushing
the boundaries of electron microscopy, we can unlock discoveries and gain a deeper understanding of
piezoelectric materials. Continuous advancements and the collaborative efforts of scientists across
disciplines will play a crucial role in expanding the capabilities and accessibility of electron microscopy for
the benefit of scientific research and technological advancements.

DECLARATIONS
Authors’ contributions
Conceptual design and manuscript draft: Cabral MJ
Manuscript revision and project supervision: Chen Z, Liao X

Availability of data and materials
Not applicable.

Financial support and sponsorship
This research was partially financially supported by the Australian Research Council (ARC) through project
DP190101155, the National Natural Science Youth Foundation of China (Grant No. 12204393), the
Research Grant Council of Hong Kong SAR, China (Project No. PolyU25300022), and the Research Office
of The Hong Kong Polytechnic University (Project Code: P0042733).