Page 130 - Read Online
P. 130

Page 4 of 16                             Xu et al. Soft Sci. 2025, 5, 43  https://dx.doi.org/10.20517/ss.2025.63

               METHODS
               Materials
               Ti AlC powders were purchased from Lianlixin Technology Co., Ltd., China. Lithium fluoride (LiF) and
                 2
               hydrochloric acid (HCl) solution were obtained from Aladdin Reagent. Silicon tetrachloride (SiCl  ≥
                                                                                                        4
               99.99%), ammonia (NH  ≥ 99.99%), Hydrogen (H  ≥ 99.99 %), and argon (Ar ≥ 99.9%) were obtained from
                                   3
                                                         2
               Xian Wei Guang Gas Co., Ltd. All compounds were utilized immediately without additional purification
               unless otherwise indicated.

               Preparation of few-layered Ti CT  nanosheets
                                            X
                                         2
               Few-layered Ti CT  nanosheets were synthesized by selectively removing aluminum atoms from Ti AlC
                                                                                                      2
                            2
                               X
               powders using an etching solution. The etchant was formulated by dissolving 1.0 g of LiF in 30 mL of 10 M
               HCl, resulting in a homogeneous acidic solution for subsequent etching reactions. The preparation
               procedure commenced with the gradual addition of Ti AlC powder into the etchant solution under constant
                                                             2
               magnetic stirring. The resultant mixture was subjected to continuous agitation at ambient temperature for
               72 h to facilitate complete etching. Subsequently, the etched powder underwent multiple centrifugation
               cycles (5 min per cycle at 6,000 rpm) using deionized (DI) water until a neutral pH of 6.5 was attained. The
               purified sediment was vacuum-dried for 72 h, and the final dried powder was kept until further use.
               Preparation of porous Ti CT /Si N  composites
                                             4
                                        X
                                     2
                                           3
               The porous Ti CT  aerogel with an aligned lamellar structure was prepared via a bidirectional freezing
                            2
                               X
               method. The homemade Teflon tubes (23 mm × 11 mm × 30 mm) were sealed with a copper plate and a
               polydimethylsiloxane (PDMS) wedge titled to an angle of 20°. Ti CT  slurry with a concentration of 10
                                                                           X
                                                                        2
               mg/mL was poured into the mold and then frozen in liquid nitrogen. The frozen samples were put in a
               vacuum freeze dryer to move the ice template for 36 h under 0.1 Pa pressure. Then the porous Ti CT /Si N 4
                                                                                                    X
                                                                                                       3
                                                                                                 2
               composite was fabricated by infiltrating Si N  into the obtained Ti CT  foams at 1,073 K in a chemical vapor
                                                                          X
                                                  3
                                                     4
                                                                      2
               infiltration furnace with a gaseous atmosphere of SiCl -NH -H -Ar system, the deposition parameters of
                                                              4
                                                                   3
                                                                      2
               SiCl -NH -H -Ar system in  Supplementary  Table 1. The specific constituents  comprised silicon
                       3
                           2
                   4
               tetrachloride as the silicon source, ammonia as the nitrogen source, and hydrogen as the dilution gas.
               Ti CT /Si N  composites were obtained after the entire chemical vapor infiltration procedure was
                    X
                 2
                       3
                         4
               completed. The chemical reaction is as follows  :
                                                       [57]
               Simulation calculation
               The model has a thickness of 5 mm in the Z-axis using the Microwaves & RF/Optical module in CST Studio
               Suite 2020, with the material set to MXene from the material library. Periodic boundary conditions are set
               in the XY-axis. A perfectly matched layer is set in the Z-axis direction and a perfectly conductive layer is set
               in the Z-axis. The incident electromagnetic wave is directed along the Z axis, and calculations are performed
               at 8.2, 10.3, and 12.4 GHz to determine current density, E, power flow, and power loss density.
               Characterization
               The X-ray diffractometer (X’Pert Pro, Philips, Netherlands) confirmed the microstructure of samples, while
               morphology was characterized on a scanning electron microscope (SEM, HITACHI S-4700, Japan) and a
               transmission electron microscope (TEM, G20, FEI Tecnai, USA). The thermal stability of Ti CT  and
                                                                                                  2
                                                                                                     X
               Ti CT /Si N  was measured in ambient air and argon respectively by a thermogravimetric analyzer (TGA,
                    X
                 2
                         4
                       3
               STA449F3, Netzsch) from 30 to 1,200 °C.
   125   126   127   128   129   130   131   132   133   134   135