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Cabral et al. Microstructures 2023;3:2023040 https://dx.doi.org/10.20517/microstructures.2023.39 Page 5 of 17

Figure 2. (A) HAADF-STEM (a) and LAADF-STEM (b and c) of a low-angle twist grain boundary between SrTiO and Nb: SrTiO ,
3 3
[25]
demonstrating the effect of crystal orientation and strain fields for the respective imaging conditions. Reprinted with permission .
Copyright © 2007 Elsevier. (B) HAADF-STEM images of NaLaMgWO ceramics taken along the [111], [110], and [100] zone axes (a-c)
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confirmed by STEM image simulations for each zone (d-f). Chemical order further confirmed by atomic resolution EDS mapping (g-i).
[26]
Reprinted with permission . Copyright © 2022 Elsevier. (C) Polarization map superimposed on HAADF-STEM image of Ca-doped
[27]
BiFeO thin films. Profiles of in-plane and out-of-plane displacement components are also displayed. Reprinted with permission .
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Copyright © 2018 American Chemical Society.
between ferroelectric domains . More recently, DPC has been implemented for atomic resolution STEM
[34]
imaging using an ADF detector with between 2-16 segments. A 4-quadrant detector is commonly utilized
where an acquired two-component vector image (DPC = a-c and DPC = b-d) is subjected to 2D
x
y
integration with the segmented detector, resulting in the iDPC image [35,39] . Figure 3C showcases instances of
iDPC imaging in gallium nitride (GaN) oriented along the [11 0] and [10 1] orientations, illustrating the
remarkable resolving power of this technique . This imaging mode is sensitive to both light and heavy
[35]
elements, less sensitive to defocus, and exhibits higher signal-to-noise ratios compared to other techniques
for imaging light elements. However, iDPC requires extremely thin, flat, and contamination-free samples