﻿<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">
  <front>
    <journal-meta>
      <journal-id journal-id-type="nlm-ta">Microstructures</journal-id>
      <journal-id journal-id-type="publisher-id">MICROSTRUCTURES</journal-id>
      <journal-title-group>
        <journal-title>Microstructures</journal-title>
      </journal-title-group>
      <issn pub-type="epub">2770-2995</issn>
      <publisher>
        <publisher-name>OAE Publishing Inc.</publisher-name>
      </publisher>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="doi">10.20517/microstructures.2026.66</article-id>
      <article-categories>
        <subj-group>
          <subject>Research Article</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Tailoring microstructure engineering to decouple electron-phonon transport in Se-based thermoelectric alloys</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <name>
            <surname>Wang</surname>
            <given-names>Haohao</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author" corresp="yes">
          <name>
            <surname>Wang</surname>
            <given-names>Guoxiang</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
          <xref ref-type="aff" rid="I2">
            <sup>2</sup>
          </xref>
          <xref ref-type="corresp" rid="cor1" />
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Xu</surname>
            <given-names>Haowei</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Chen</surname>
            <given-names>Yingqi</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Shi</surname>
            <given-names>Haowei</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
        </contrib>
      </contrib-group>
      <aff id="I1">
        <sup>1</sup>Laboratory of Infrared Materials and Devices, The Research Institute of Advanced Technologies, Ningbo University, Ningbo 315211, Zhejiang, China.</aff>
      <aff id="I2">
        <sup>2</sup>Key Laboratory of Photoelectric Detection Materials and Devices of Zhejiang Province, Ningbo 315211, Zhejiang, China.</aff>
      <author-notes>
        <corresp id="cor1">Correspondence to: Prof. Guoxiang Wang, Laboratory of Infrared Materials and Devices, The Research Institute of Advanced Technologies, Ningbo University, Ningbo 315211, Zhejiang, China. E-mail: <email>wangguoxiang@nbu.edu.cn</email></corresp>
        <fn fn-type="other">
          <p>
            <bold>Received:</bold> 7 Apr 2026 |  <bold>First Decision:</bold> 25 May 2026 |  <bold>Revised:</bold> 4 Jun 2026 |  <bold>Accepted:</bold> 6 Jul 2026 |  <bold>Published:</bold> 22 Sep 2026</p>
        </fn>
        <fn fn-type="other">
          <p>
            <bold>Academic Editor:</bold> Zhigang Chen | <bold>Copy Editor:</bold> Ping Zhang |  <bold>Production Editor:</bold> Ping Zhang</p>
        </fn>
      </author-notes>
	  <pub-date pub-type="ppub">
        <year>2026</year>
      </pub-date>
      <pub-date pub-type="epub">
        <day>22</day>
        <month>9</month>
        <year>2026</year>
      </pub-date>
      <volume>6</volume>
	  <issue>5</issue>
      <elocation-id>20260125</elocation-id>
      <permissions>
        <copyright-statement>© The Author(s) 2026.</copyright-statement>
        <license xlink:href="https://creativecommons.org/licenses/by/4.0/">
          <license-p>© The Author(s) 2026. <bold>Open Access</bold> This article is licensed under a Creative Commons Attribution 4.0 International License (<uri xlink:href="https://creativecommons.org/licenses/by/4.0/">https://creativecommons.org/licenses/by/4.0/</uri>), which permits unrestricted use, sharing, adaptation, distribution and reproduction in any medium or format, for any purpose, even commercially, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.</license-p>
        </license>
      </permissions>
      <abstract>
        <p>Selenide compounds are known for their intrinsically low thermal conductivity, yet their thermoelectric application is often hindered by poor electrical transport. Here we examine how this limitation manifests in three different systems, Sn-Se, Sb-Se, and Bi-Se, by correlating their microstructures with measured transport properties. Sn-Se forms a composite containing crystalline SnSe, elemental Se, and amorphous regions, resulting in ultralow lattice thermal conductivity [0.08 W/(m·K) at 650 K] but limited carrier mobility [~7.39 cm<sup>2</sup>/(V·s)]. Sb-Se is largely amorphous with scattered Sb<sub>2</sub>Se<sub>3</sub> crystallites, yielding extremely low electrical conductivity (~6.86 × 10<sup>-2</sup> S/m at 300 K) despite a high Seebeck coefficient (1,902 μV/K). Bi-Se develops a distinct two-phase structure comprising metallic Bi nanoprecipitates embedded in a semiconducting Bi<sub>2</sub>Se<sub>3</sub> matrix. This configuration enables efficient charge transport through interconnected Bi pathways [<italic>μ</italic> ≈ <InlineParagraph>2,170 cm<sup>2</sup>/(V·s)].</InlineParagraph> The electrical conductivity reaches 1.56 × 10<sup>4</sup> S/m at room temperature and exceeds 3.7 × 10<sup>4</sup> S/m at elevated temperatures, while the Bi<sub>2</sub>Se<sub>3</sub> matrix preserves a reasonable Seebeck coefficient. Additionally, atomic-scale disorder at the Bi/Bi<sub>2</sub>Se<sub>3</sub> interfaces enhances phonon scattering, reducing lattice thermal conductivity without severely impeding electron flow. As a result, the Bi-Se system achieves a peak thermoelectric figure of merit (<italic>ZT</italic>) of approximately 0.85 at 400 K, demonstrating excellent low-temperature performance, while the Sn-Se system reaches a <italic>ZT</italic> of ~1.0 at 650 K, suitable for mid-temperature applications. These findings suggest that incorporating a metallic secondary phase into a semiconducting matrix can help balance the competing requirements for thermoelectric performance, although the optimal operating temperature range depends on the specific microstructure.</p>
      </abstract>
      <kwd-group>
        <kwd>Bi/Bi<sub>2</sub>Se<sub>3 </sub>heterostructure</kwd>
        <kwd>thermoelectric properties</kwd>
        <kwd>electron-phonon transport properties</kwd>
        <kwd>thermoelectric figure-of-merit</kwd>
      </kwd-group>
    </article-meta>
  </front>
  <body>
    <sec id="sec1">
      <title>INTRODUCTION</title>
      <p>Thermoelectric materials, as functional materials capable of direct conversion between thermal energy and electrical energy, hold significant application value in cutting-edge fields such as industrial waste heat recovery, power sources for space probes, and solid-state refrigeration. Their energy conversion efficiency is governed by the dimensionless thermoelectric figure of merit, <italic>ZT</italic> = <italic>S</italic>²<italic>σT</italic>/<italic>κ</italic>, where <italic>S</italic> is the Seebeck coefficient, <italic>σ</italic> is the electrical conductivity, <italic>κ</italic> is the total thermal conductivity, and <italic>T</italic> is the absolute temperature<sup>[<xref ref-type="bibr" rid="B1">1</xref>]</sup>. An ideal thermoelectric material requires both a high power factor (<italic>PF</italic> = <italic>S²σ</italic>) and a low thermal conductivity. However, an inherent interdependence exists among these physical parameters<sup>[<xref ref-type="bibr" rid="B2">2</xref>]</sup>: enhancing electrical conductivity by increasing carrier concentration typically leads to a significant reduction in the Seebeck coefficient and a sharp increase in the electronic thermal conductivity. This mutually constraining relationship poses a substantial challenge for the performance optimization of thermoelectric materials.</p>
      <p>In recent years, selenium-based thermoelectric materials have been widely investigated due to their unique phonon transport properties and favorable Seebeck coefficients<sup>[<xref ref-type="bibr" rid="B3">3</xref>]</sup>. These materials often exhibit a high intrinsic Seebeck coefficient and low lattice thermal conductivity, demonstrating promising thermoelectric potential<sup>[<xref ref-type="bibr" rid="B4">4</xref>]</sup>. However, the commonly encountered issue of insufficient electrical conductivity severely limits the enhancement of their overall performance<sup>[<xref ref-type="bibr" rid="B5">5</xref>]</sup>. Various selenium-based compounds exhibit significant differences in their microstructures and electro-acoustic transport mechanisms. For example, in SnSe, targeted strategies such as crystal defect engineering (e.g., manipulating intrinsic vacancy defects to enhance phonon scattering<sup>[<xref ref-type="bibr" rid="B6">6</xref>]</sup>) and interface/structure engineering (e.g., tuning crystal symmetry through doping/alloying to decouple electron-phonon transport<sup>[<xref ref-type="bibr" rid="B7">7</xref>]</sup>) have been successfully explored to enhance the power factor while preserving low thermal conductivity. These approaches highlight the potential to optimize thermoelectric transport through precise microstructural manipulation. Hence, clarifying the structure-property relationships in diverse systems will provide critical insights into the fundamental thermoelectric properties and lay the groundwork for devising effective decoupling strategies<sup>[<xref ref-type="bibr" rid="B8">8</xref>]</sup>.</p>
      <p>Therefore, we select three representative selenide systems, Sn-Se, Sb-Se, and Bi-Se, for a comprehensive investigation of their microstructure and thermoelectric properties by systematic microstructural characterization and thermoelectric performance measurements<sup>[<xref ref-type="bibr" rid="B9">9</xref>]</sup>. While Sn-Se and Sb-Se show limited performance due to insufficient electrical conductivity, the Bi-Se system exhibits exceptional thermoelectric performance originating from a Bi/Bi<sub>2</sub>Se<sub>3</sub> two-phase composite architecture. This unique structure integrates a high-mobility metallic Bi phase for efficient carrier transport and a semiconducting Bi<sub>2</sub>Se<sub>3</sub> matrix for maintaining a reasonable Seebeck coefficient, while interfacial dislocations and disorder strongly scatter phonons<sup>[<xref ref-type="bibr" rid="B10">10</xref>,<xref ref-type="bibr" rid="B11">11</xref>]</sup>. Our study highlights an effective semiconductor-metal composite engineering strategy to decouple electrical and thermal transport, providing a viable pathway for designing high-performance selenide-based thermoelectric materials<sup>[<xref ref-type="bibr" rid="B12">12</xref>]</sup>.</p>
    </sec>
    <sec id="sec2">
      <title>MATERIALS AND METHODS</title>
      <p>Bulk samples of Sn-Se, Sb-Se, and Bi-Se were synthesized via a combined vacuum melting and hot‑pressing approach. High‑purity elemental powders (Sn, Sb, Bi, Se, ≥ 99.99%) were weighed according to the nominal compositions Sn<sub>0.51</sub>Se<sub>0.49</sub>, Sb<sub>0.41</sub>Se<sub>0.59,</sub> and Bi<sub>0.60</sub>Se<sub>0.40</sub> [<inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures6066-SupplementaryMaterials.pdf">Supplementary Figures 1</inline-supplementary-material> and <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures6066-SupplementaryMaterials.pdf">2</inline-supplementary-material>], and sealed in evacuated quartz tubes (&lt;10<sup>-3</sup> Pa). The tubes were heated to 300 °C at 2 °C/min and held for 2 h, then further heated to 650 °C at 1 °C/min and annealed for 12 h, followed by furnace cooling. The obtained ingots were ground into fine powders and consolidated by vacuum hot‑pressing in a graphite die at 450 °C under 5 MPa for 1 h, yielding dense cylindrical pellets (Φ 10 mm × ~10 mm) with relative densities above 95%.</p>
      <p>Seebeck coefficient (<italic>S</italic>) and electrical conductivity (<italic>σ</italic>) were measured using a Cryoall CTA analyzer (Ar atmosphere, negative pressure). Thermal diffusivity (D) was obtained by laser flash analysis (Netzsch LFA-467). Total thermal conductivity (<italic>κ</italic>) was derived from <italic>κ</italic> = <italic>D</italic>·<italic>ρ</italic>·<italic>Cp</italic>, where <italic>D</italic>, <italic>ρ</italic>, and <italic>Cp</italic> denote thermal diffusivity, density, and specific heat capacity, respectively. Carrier concentration (<italic>n</italic>) was determined by Hall-effect measurements under ambient conditions. The mobility (<italic>μ</italic>) was calculated by the equation <italic>σ</italic> = <italic>neμ</italic>. The crystallinity and composition of the samples were examined by X-ray diffraction (XRD) (<italic>λ</italic> = 0.154 nm, <InlineParagraph>36 kV,</InlineParagraph> <InlineParagraph>20 mA).</InlineParagraph> Scanning transmission electron microscopy (STEM), high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM), and energy-dispersive X-ray spectroscopy (EDS) were performed on a Talos F200X field-emission transmission electron microscope (FEI) operating at <InlineParagraph>200 kV,</InlineParagraph> coupled with EDS for elemental mapping.</p>
    </sec>
    <sec id="sec3">
      <title>RESULTS AND DISCUSSION</title>
      <p>X-ray photoelectron spectroscopy (XPS) was employed to investigate the surface chemical states and bonding environments of the three systems. As shown in <xref ref-type="fig" rid="fig1">Figure 1</xref>, the Bi 4f spectrum of the Bi-Se system displays characteristic doublet peaks at 158.53 eV (Bi 4f<sub>7/2</sub>) and 163.85 eV (Bi 4f<sub>5/2</sub>), corresponding to Bi-Se bonds in the Bi<sub>2</sub>Se<sub>3</sub> phase. A weaker doublet at 157.8 eV and 162.9 eV, positively shifted by about 0.8 eV relative to standard metallic Bi, indicates interfacial charge transfer between metallic Bi nanoparticles and the p-type Bi<sub>2</sub>Se<sub>3</sub> matrix - consistent with the metallic Bi diffraction observed by XRD [<inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures6066-SupplementaryMaterials.pdf">Supplementary Figure 3</inline-supplementary-material>]<sup>[<xref ref-type="bibr" rid="B13">13</xref>]</sup>. In the Sb-Se system, the Sb 3d<sub>5/2</sub> binding energy at 529.90 eV and the main Se 3d peak at 54.5 eV both confirm Sb-Se bonding, supporting the single-phase Sb<sub>2</sub>Se<sub>3</sub> structure<sup>[<xref ref-type="bibr" rid="B14">14</xref>]</sup>. For the Sn-Se system, the Sn 3d<sub>5/2</sub> peak at 486.93 eV is characteristic of Sn-Se bonds in SnSe, while the Se 3d doublet (54.20 eV and 55.18 eV) reveals two distinct chemical environments for Se, corroborating the SnSe/Se composite phase identified in XRD<sup>[<xref ref-type="bibr" rid="B15">15</xref>]</sup>. These XPS results elucidate the distinct bonding nature of each system at the atomic scale: Sb-Se as a single-phase compound, Bi-Se as a metal-compound (Bi<sub>2</sub>Se<sub>3</sub>/Bi) composite, and Sn-Se as a compound-elemental selenium (SnSe/Se) composite, providing a foundation for further microstructural analysis by transmission electron microscopy<sup>[<xref ref-type="bibr" rid="B16">16</xref>,<xref ref-type="bibr" rid="B17">17</xref>]</sup>.</p>
      <fig id="fig1" position="float" width="450">
        <label>Figure 1</label>
        <caption>
          <p>X-ray photoelectron spectroscopy (XPS) spectra of (A) Sn 3d and (B) Se 3d for Sn-Se; (C) Sb 3d and (D) Se 3d for Sb-Se; (E) Bi 4f and (F) Se 3d for Bi-Se.</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures6066.fig.1.jpg" />
      </fig>
      <p>
        <xref ref-type="fig" rid="fig2">Figure 2</xref> systematically presents the temperature-dependent thermoelectric properties of the Sn-Se, Sb-Se, and Bi-Se systems. As shown in <xref ref-type="fig" rid="fig2">Figure 2A</xref>, the ranking of <italic>κ<sub>L</sub></italic> is not constant with temperature. Sn-Se has the lowest <italic>κ<sub>L</sub></italic> up to ~450 K, but above ~500 K, Bi-Se becomes the lowest. Sb-Se remains the highest across most of the temperature range. The electronic thermal conductivity <italic>κ<sub>e</sub></italic> [<xref ref-type="fig" rid="fig2">Figure 2B</xref>] is dominated by Bi-Se due to its high electrical conductivity, contributing significantly to the total <italic>κ</italic> [<xref ref-type="fig" rid="fig2">Figure 2C</xref>]. Bi-Se maintains a moderate total <italic>κ</italic> [0.45-0.61 W/(m·K)], whereas Sn-Se exhibits an ultralow <italic>κ</italic> <InlineParagraph>[0.17-0.08 W/(m·K)].</InlineParagraph> Hall measurements [<xref ref-type="fig" rid="fig2">Figure 2D</xref>] reveal that Bi-Se possesses high carrier concentration (4.49 × 10<sup>17</sup> cm<sup>-3</sup>), leading to superior electrical conductivity <italic>σ</italic> [<xref ref-type="fig" rid="fig2">Figure 2E</xref>], which exceeds 3.7 × 10<sup>4</sup> S/m above 400 K. Notably, <italic>σ</italic> of the Bi-Se composite increases with temperature (from 1.56 × 10<sup>4</sup> S/m at 300 K to 3.75 × 10<sup>4</sup> S/m at 650 K, as shown in <xref ref-type="fig" rid="fig2">Figure 2E</xref>). This behavior, contrary to pure metals, originates from the competition between the decreasing conductivity of the metallic Bi phase and the rising conductivity of the Bi<sub>2</sub>Se<sub>3</sub> matrix due to intrinsic excitation at elevated temperatures.</p>
      <fig id="fig2" position="float">
        <label>Figure 2</label>
        <caption>
          <p>Thermoelectric properties of Sn-Se, Sb-Se and Bi-Se samples. Temperature-dependent profiles of (A) lattice thermal conductivity (<italic>κ<sub>L</sub></italic>), (B) electronic thermal conductivity (<italic>κ<sub>e</sub></italic>), (C) thermal conductivity (<italic>κ</italic>), (D) carrier mobility (<italic>μ</italic>) and carrier concentration (<italic>n</italic>), (E) electrical conductivity (<italic>σ</italic>), (F) Seebeck coefficient (<italic>S</italic>), (G) power factor (<italic>PF</italic>), and (H) dimensionless figure of merit (<italic>ZT</italic>).</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures6066.fig.2.jpg" />
      </fig>
      <p>Conversely, Sb-Se shows extremely low <italic>σ</italic> (&lt; 0.1 S/m), and Sn-Se exhibits <italic>σ</italic> ranging from 8.8 S/m at 300 K to 350 S/m at 650 K. The Seebeck coefficient S [<xref ref-type="fig" rid="fig2">Figure 2F</xref>] is highest for Sb-Se (1,902 μV/K at 300 K) and Sn-Se (979 μV/K at 300 K), but lower for Bi-Se (233 μV/K at 300 K) due to its high carrier density. Consequently, the power factor <italic>PF</italic> [<xref ref-type="fig" rid="fig2">Figure 2G</xref>] is the highest in Bi-Se, reaching a maximum of ~953 μW/(m·K<sup>2</sup>) at 400 K. Ultimately, the dimensionless figure of merit <italic>ZT</italic> [<xref ref-type="fig" rid="fig2">Figure 2H</xref>] peaks at ~0.85 around 400 K for Bi-Se, remaining above 0.6 up to 650 K. Sn-Se achieves <italic>ZT</italic> ~1.0 at 650 K, while Sb-Se shows negligible <italic>ZT</italic> due to its extremely low <italic>σ</italic>. The concurrent high <italic>σ</italic> and moderate <italic>κ</italic> in Bi-Se signify effective decoupling of electrical and thermal transport, attributable to its unique composite microstructure<sup>[<xref ref-type="bibr" rid="B18">18</xref>,<xref ref-type="bibr" rid="B19">19</xref>]</sup>.</p>
      <p>To elucidate the thermoelectric properties of Sn-Se, transmission electron microscopy (TEM) was employed. Multi-scale images (<xref ref-type="fig" rid="fig3">Figure 3A</xref>-<xref ref-type="fig" rid="fig3">C</xref>, 50 nm to 5 nm) confirm its composite nature. Lattice analysis of regions in <xref ref-type="fig" rid="fig3">Figure 3C</xref> [<xref ref-type="fig" rid="fig3">Figure 3D</xref>-<xref ref-type="fig" rid="fig3">G</xref>] identifies SnSe in A1 [0.209 nm, (020)], A2 [0.294 nm, (400)], elemental Se in A3 [0.212 nm, (002)] and A4 [0.311 nm, (111)]. Dislocation maps [<xref ref-type="fig" rid="fig3">Figure 3H</xref>-<xref ref-type="fig" rid="fig3">K</xref>] reveal sparse dislocations in SnSe [<xref ref-type="fig" rid="fig3">Figure 3I</xref>] but a high density in Se [<xref ref-type="fig" rid="fig3">Figure 3K</xref>], forming a multi-scale phonon-scattering network central to its ultralow lattice thermal conductivity. Further imaging [<xref ref-type="fig" rid="fig3">Figure 3L</xref>-<xref ref-type="fig" rid="fig3">M</xref>] shows coexisting crystalline and amorphous phases. The crystalline/amorphous interface [<xref ref-type="fig" rid="fig3">Figure 3N</xref>] exhibits atomic disorder and dislocation accumulation, further enhancing phonon scattering. Regions B1-B4 in <xref ref-type="fig" rid="fig3">Figure 3M</xref> are identified as SnSe via lattice analysis [<xref ref-type="fig" rid="fig3">Figure 3O</xref>-<xref ref-type="fig" rid="fig3">R</xref>], with spacings of 0.248 nm (401), 0.358 nm (201), <InlineParagraph>0.310 nm,</InlineParagraph> and 0.312 nm (011)<sup>[<xref ref-type="bibr" rid="B20">20</xref>,<xref ref-type="bibr" rid="B21">21</xref>]</sup>.</p>
      <fig id="fig3" position="float">
        <label>Figure 3</label>
        <caption>
          <p>Microstructure characterization of the Sn-Se system. (A-C) TEM images at successively higher magnifications: 50, 20, and 5 nm scales; (D-G) Lattice analysis diagrams corresponding to regions A1, A2, A3, and A4 in (C), respectively; (H and I) Atomic arrangement and dislocation diagrams for region A2; (J and K) the corresponding diagrams for region A3; (L and M) TEM images at 10 nm and 5 nm scales, respectively; (N) Atomic dislocation diagram at the interface between the crystalline region B1 and the amorphous domain; (O-R) Lattice analysis diagrams for regions B1 to B4 in (M). TEM: Transmission electron microscopy.</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures6066.fig.3.jpg" />
      </fig>
      <p>The presence of the amorphous phase and the high density of defects at the crystalline/amorphous interfaces impose strong scattering on charge carriers. As a result, this leads to a marked reduction in carrier mobility to approximately 7.39 cm<sup>2</sup>/(V·s) and a correspondingly low electrical conductivity of only 8.76 S/m at 300 K, while simultaneously reducing lattice thermal conductivity<sup>[<xref ref-type="bibr" rid="B22">22</xref>]</sup>. This provides profound insight into the complex trade-off between electrical and thermal transport parameters in the Sn-Se system: the abundant phase interfaces and defect structures effectively suppress phonon transport but inevitably impede the directional migration of carriers, yielding poor electrical conductivity<sup>[<xref ref-type="bibr" rid="B23">23</xref>]</sup>. The Seebeck coefficient of the Sn-Se system exhibits a systematic temperature dependence, decreasing from 979.7 μV/K at 300 K to 594.4 μV/K at 650 K. Although the Seebeck coefficient decreases with increasing temperature, its absolute value remains relatively high at 650 K. This is attributed to the moderate carrier concentration in the system, which avoids the severe degradation of the Seebeck coefficient typical of heavy doping while still providing sufficient carriers for transport<sup>[<xref ref-type="bibr" rid="B24">24</xref>]</sup>.</p>
      <p>TEM analysis of the single-phase Sb<sub>2</sub>Se<sub>3</sub> system reveals a microstructure dominated by an amorphous matrix with embedded crystalline domains [<xref ref-type="fig" rid="fig4">Figure 4A</xref>-<xref ref-type="fig" rid="fig4">C</xref>]. Lattice analysis of <xref ref-type="fig" rid="fig4">Figure 4C</xref> confirms the crystalline regions as Sb<sub>2</sub>Se<sub>3</sub>, region A1 exhibits spacings of 0.601 nm (020) and 0.324 nm (230) [<xref ref-type="fig" rid="fig4">Figure 4D</xref>], region A2 shows 0.601 nm (020) [<xref ref-type="fig" rid="fig4">Figure 4E</xref>], region A3 shows 0.312 nm (211) [<xref ref-type="fig" rid="fig4">Figure 4F</xref>], and region A4 shows <InlineParagraph>0.413 nm (220)</InlineParagraph> [<xref ref-type="fig" rid="fig4">Figure 4G</xref>]. A dislocation map of region A2 is shown in <xref ref-type="fig" rid="fig4">Figure 4H</xref>. Additional crystalline regions are presented in <xref ref-type="fig" rid="fig4">Figure 4I</xref>-<xref ref-type="fig" rid="fig4">K</xref> (with a further magnified view in <xref ref-type="fig" rid="fig4">Figure 4J</xref>), and a dislocation map of region B1 is given in <xref ref-type="fig" rid="fig4">Figure 4K</xref>. Further views at 10 nm and 5 nm are shown in <xref ref-type="fig" rid="fig4">Figure 4L</xref> and <xref ref-type="fig" rid="fig4">M</xref>, respectively. The spacings of these crystalline regions are consistent with Sb<sub>2</sub>Se<sub>3</sub>, such as 0.598 nm for B1 (020) in <xref ref-type="fig" rid="fig4">Figure 4J</xref> and 0.312/0.620 nm for C1 [(211)/(200)] in <xref ref-type="fig" rid="fig4">Figure 4N</xref>. Lattice analysis diagrams of regions C1 and C2 are provided in <xref ref-type="fig" rid="fig4">Figure 4N</xref> and <xref ref-type="fig" rid="fig4">O</xref>, respectively. Dislocation maps of regions I and II are shown in <xref ref-type="fig" rid="fig4">Figure 4P</xref> and <xref ref-type="fig" rid="fig4">Q</xref>. Overall, dislocation maps [<xref ref-type="fig" rid="fig4">Figure 4H</xref>, <xref ref-type="fig" rid="fig4">K</xref>, <xref ref-type="fig" rid="fig4">P</xref> and <xref ref-type="fig" rid="fig4">Q</xref>] show sparse dislocations within the grains.</p>
      <fig id="fig4" position="float">
        <label>Figure 4</label>
        <caption>
          <p>Microstructure characterization of the Sb-Se system. (A-C) TEM images at progressively higher magnifications: 50, 20, and <InlineParagraph>5 nm</InlineParagraph> scales; (D-G) Lattice analysis diagrams corresponding to regions A1, A2, A3, and A4 in (C), respectively; (H) Atomic dislocation map of region A2; (I-M) Additional TEM images and magnified views: (I) at 20 nm, (J) further magnified, (L) at 10 nm, and (M) at 5 nm scales. (K) Atomic dislocation map of region B1; (N and O) Lattice analysis diagrams of regions C1 and C2, respectively; (P and Q) Atomic dislocation maps of region I and region II, respectively. TEM: Transmission electron microscopy.</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures6066.fig.4.jpg" />
      </fig>
      <p>This specific structure dictates its thermoelectric properties. The high amorphous fraction (evident in <xref ref-type="fig" rid="fig4">Figure 4B</xref>, <xref ref-type="fig" rid="fig4">I</xref> and <xref ref-type="fig" rid="fig4">L</xref>) strongly suppresses phonon transport, yielding a low lattice thermal conductivity of <InlineParagraph>~0.333 W/(m·K)</InlineParagraph> at 300 K. However, the same amorphous matrix severely scatters charge carriers, leading to very low carrier mobility [~0.76 cm<sup>2</sup>/(V·s)] and extremely low electrical conductivity (~6.86 × 10<sup>-2</sup> S/m at <InlineParagraph>300 K)<sup>[<xref ref-type="bibr" rid="B25">25</xref>]</sup>.</InlineParagraph> Consequently, despite possessing a high Seebeck coefficient (1,902 μV/K at 300 K) due to its low carrier concentration (~5.6 × 10<sup>16</sup> cm<sup>-3</sup>), the material exhibits a very low power factor [~0.248 μW/(m·K<sup>2</sup>)] and a negligible <italic>ZT</italic> (~2.23 × 10<sup>-4</sup> at 300 K). This case exemplifies how excessive amorphization, while beneficial for reducing thermal conductivity, can drastically deteriorate electrical transport, ultimately limiting thermoelectric performance<sup>[<xref ref-type="bibr" rid="B26">26</xref>]</sup>.</p>
      <p>TEM reveals the nanocomposite structure of the Bi-Se system. Multi-scale images (<xref ref-type="fig" rid="fig5">Figure 5A</xref>-<xref ref-type="fig" rid="fig5">C</xref>, 50 nm to <InlineParagraph>5 nm)</InlineParagraph> show metallic Bi precipitates embedded in a Bi<sub>2</sub>Se<sub>3</sub> matrix. Crystallographic analysis of <xref ref-type="fig" rid="fig5">Figure 5C</xref> identifies Bi<sub>2</sub>Se<sub>3</sub> in regions A1 [0.215 nm (1010), <xref ref-type="fig" rid="fig5">Figure 5D</xref>], metallic Bi in region X [0.248 nm (210), <xref ref-type="fig" rid="fig5">Figure 5E</xref>], Bi<sub>2</sub>Se<sub>3</sub> in region A2 [0.312 nm (011), <xref ref-type="fig" rid="fig5">Figure 5F</xref>], and Bi<sub>2</sub>Se<sub>3</sub> in region A3 [0.292 nm (015), <xref ref-type="fig" rid="fig5">Figure 5G</xref>]. Atomic-scale image of region I in <xref ref-type="fig" rid="fig5">Figure 5C</xref> [<xref ref-type="fig" rid="fig5">Figure 5H</xref>] confirms ordered atomic arrangement, and its corresponding dislocation map [<xref ref-type="fig" rid="fig5">Figure 5I</xref>] reveals a high density of defects at the Bi<sub>2</sub>Se<sub>3</sub>/Bi interfaces. Similarly, region II [<xref ref-type="fig" rid="fig5">Figure 5J</xref>] shows ordered atomic arrangement, with its dislocation map [<xref ref-type="fig" rid="fig5">Figure 5K</xref>] also revealing defects. Some disorder can be found in <xref ref-type="fig" rid="fig5">Figure 5L</xref>, where the crystalline regions Y1, Y2, B1, and Y3 can be enlarged in <xref ref-type="fig" rid="fig5">Figure 5M</xref>. Y1 and Y2 can be determined as Bi phases in <xref ref-type="fig" rid="fig5">Figure 5N</xref>-<xref ref-type="fig" rid="fig5">O</xref>. According to <xref ref-type="fig" rid="fig5">Figure 5P</xref>, B1 and Y3 can be identified as Bi<sub>2</sub>Se<sub>3</sub> and Bi phases in <xref ref-type="fig" rid="fig5">Figure 5Q</xref>-<xref ref-type="fig" rid="fig5">R</xref>, respectively. These pervasive interfacial defects, documented in <xref ref-type="fig" rid="fig5">Figure 5S</xref>-<xref ref-type="fig" rid="fig5">V</xref>, act as effective multi-frequency phonon scattering centers, significantly suppressing phonon transport and reducing the lattice thermal conductivity<sup>[<xref ref-type="bibr" rid="B5">5</xref>,<xref ref-type="bibr" rid="B27">27</xref>]</sup>. In parallel, the interconnected network of metallic Bi precipitates provides highly efficient pathways for charge carriers, as evidenced by the ultrahigh Hall mobility<sup>[<xref ref-type="bibr" rid="B28">28</xref>]</sup>. This unique microstructure yields excellent electrical transport: a high carrier concentration (~4.49 × 10<sup>17</sup> cm<sup>-3</sup>), exceptional mobility [~2,170 cm<sup>2</sup>/(V·s)], and a high electrical conductivity of 1.56 × 10<sup>4</sup> S/m at 300 K. The Bi<sub>2</sub>Se<sub>3</sub> matrix maintains a relatively high Seebeck coefficient, and its synergy with the high conductivity from the Bi network results in a maximum power factor [<italic>PF</italic> ≈ <InlineParagraph>953 μW/(m·K<sup>2</sup>)</InlineParagraph> at 400 K].</p>
      <fig id="fig5" position="float">
        <label>Figure 5</label>
        <caption>
          <p>Microstructure characterization of the Bi-Se system. (A-C) TEM images at successively higher magnifications: 50, 20, and 5 nm scales; (D-G) Lattice analysis diagrams corresponding to regions A1, X, A2, and A3 in (C), respectively; (H and I) Atomic arrangement and dislocation maps for region I; (J and K) the corresponding maps for region II; (L and M) Additional TEM images at 20 nm and 10 nm scales; (N and O) Lattice analysis diagrams for regions Y1 and Y2 in (M); (P) Additional TEM image at 5 nm scale; (Q and R) Lattice analysis diagrams for regions B1 and Y3 in (P); (S-V) Atomic dislocation maps for region Y1, region Y2, region B1, and region III, respectively. TEM: Transmission electron microscopy.</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures6066.fig.5.jpg" />
      </fig>
      <p>Although the relatively high carrier concentration and small effective mass (0.068 <italic>m<sub>0</sub></italic>) impose certain limitations on the Seebeck coefficient, the synergistic optimization of electro-phonon transport, combining the high conductivity of metallic Bi, the sustained Seebeck coefficient from the Bi<sub>2</sub>Se<sub>3</sub> phase, and the strong phonon scattering at the two-phase interfaces, collectively enables Bi-Se to deliver excellent thermoelectric performance over a wide temperature range, with a peak <italic>ZT</italic> of approximately 0.85 at 400 K)<sup>[<xref ref-type="bibr" rid="B29">29</xref>,<xref ref-type="bibr" rid="B30">30</xref>]</sup>.</p>
    </sec>
    <sec id="sec4">
      <title>CONCLUSION</title>
      <p>We systematically compared the thermoelectric performance and microstructures of Sn-Se, Sb-Se, and Bi-Se. Sn-Se and Sb-Se are limited by low electrical conductivity; however, Sn-Se achieves a <italic>ZT</italic> of ~1.0 at 650 K, owing to its ultralow lattice thermal conductivity [~0.08 W/(m·K)] from amorphous Se and abundant crystalline/amorphous interfaces. In contrast, Bi-Se exhibits a peak <italic>ZT</italic> of ~0.85 at 400 K and maintains <italic>ZT</italic> &gt; 0.6 up to 650 K. This performance originates from its Bi/Bi<sub>2</sub>Se<sub>3</sub> two-phase composite: metallic Bi precipitates provide high-mobility conduction pathways [μ ≈ 2,170 cm<sup>2</sup>/(V·s)], while the Bi<sub>2</sub>Se<sub>3</sub> matrix retains a Seebeck coefficient of ~233 μV/K at room temperature. This work demonstrates that semiconductor - metal composite engineering effectively decouples electrical and thermal transport, offering a promising strategy for high-performance selenide-based thermoelectrics.</p>
    </sec>
  </body>
  <back>
    <sec>
      <title>DECLARATIONS</title>
      <sec>
        <title>Authors’ contributions</title>
        <p>Writing - original draft; conceptualization; data curation; methodology; formal analysis; investigation: Wang, H.</p>
        <p>Writing - review &amp; editing; investigation: Xu, H.</p>
        <p>Writing - review &amp; editing; supervision; investigation: Chen, Y.</p>
        <p>Writing - review &amp; editing; supervision; resources; project administration; funding acquisition: Wang, G.</p>
        <p>Data curation: Shi, H.</p>
      </sec>
      <sec>
        <title>Availability of data and materials</title>
        <p>The data supporting the findings of this study are available within this Article and its <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures6066-SupplementaryMaterials.pdf">Supplementary Materials</inline-supplementary-material>. Further data are available from the corresponding authors upon request.</p>
      </sec>
      <sec>
        <title>AI and AI-assisted tools statement</title>
        <p>Not applicable.</p>
      </sec>
      <sec>
        <title>Financial support and sponsorship</title>
        <p>This work was supported by the Natural Science Foundation of Ningbo City, China (Grant No. 2022J072), the Zhejiang Provincial Natural Science Foundation of China (Grant No. LD26F050003), the Fundamental Research Funds for the Provincial Universities of Zhejiang (Grant No. SJLZ2024004), and the K. C. Wong Magna Fund at Ningbo University.</p>
      </sec>
      <sec>
        <title>Conflicts of interest</title>
        <p>All authors declared that there are no conflicts of interest.</p>
      </sec>
      <sec>
        <title>Ethical approval and consent to participate</title>
        <p>Not applicable.</p>
      </sec>
      <sec>
        <title>Consent for publication</title>
        <p>Not applicable.</p>
      </sec>
      <sec>
        <title>Copyright</title>
        <p>© The Author(s) 2026.</p>
      </sec>
      <sec sec-type="supplementary-material">
        <title>Supplementary Materials</title>
        <supplementary-material content-type="local-data">
          <media xlink:href="microstructures6066-SupplementaryMaterials.pdf" mimetype="application/pdf">
            <caption>
              <p>Supplementary Materials</p>
            </caption>
          </media>
        </supplementary-material>
      </sec>
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