﻿<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.0 20120330//EN" "http://jats.nlm.nih.gov/publishing/1.0/JATS-journalpublishing1.dtd">
<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">
  <front>
    <journal-meta>
      <journal-id journal-id-type="nlm-ta">Microstructures</journal-id>
      <journal-id journal-id-type="publisher-id">MICROSTRUCTURES</journal-id>
      <journal-title-group>
        <journal-title>Microstructures</journal-title>
      </journal-title-group>
      <issn pub-type="epub">2770-2995</issn>
      <publisher>
        <publisher-name>OAE Publishing Inc.</publisher-name>
      </publisher>
    </journal-meta>
    <article-meta>
      <article-id pub-id-type="doi">10.20517/microstructures.2025.91</article-id>
      <article-categories>
        <subj-group>
          <subject>Research Article</subject>
        </subj-group>
      </article-categories>
      <title-group>
        <article-title>Entropy engineering in ferroelectric/dielectric superlattices for ultrahigh-efficiency superparaelectrics energy storage capacitors</article-title>
      </title-group>
      <contrib-group>
        <contrib contrib-type="author">
          <name>
            <surname>Chen</surname>
            <given-names>Qianxin</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
          <xref ref-type="aff" rid="I2">
            <sup>2</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Cheng</surname>
            <given-names>Mingqiang</given-names>
          </name>
          <xref ref-type="aff" rid="I3">
            <sup>3</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Su</surname>
            <given-names>Peipei</given-names>
          </name>
          <xref ref-type="aff" rid="I4">
            <sup>4</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Wang</surname>
            <given-names>Jinbin</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author" corresp="yes">
          <name>
            <surname>Zhong</surname>
            <given-names>Xiangli</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
          <xref ref-type="corresp" rid="cor1" />
          <contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-2639-9131</contrib-id>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Song</surname>
            <given-names>Hongjia</given-names>
          </name>
          <xref ref-type="aff" rid="I1">
            <sup>1</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author">
          <name>
            <surname>Li</surname>
            <given-names>Jiangyu</given-names>
          </name>
          <xref ref-type="aff" rid="I3">
            <sup>3</sup>
          </xref>
        </contrib>
        <contrib contrib-type="author" corresp="yes">
          <name>
            <surname>Zhong</surname>
            <given-names>Gaokuo</given-names>
          </name>
          <xref ref-type="aff" rid="I2">
            <sup>2</sup>
          </xref>
          <xref ref-type="corresp" rid="cor1" />
        </contrib>
      </contrib-group>
      <aff id="I1">
        <sup>1</sup>National-Provincial Laboratory of Special Function Thin Film Materials, School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, Hunan, China.</aff>
      <aff id="I2">
        <sup>2</sup>Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, Hunan, China.</aff>
      <aff id="I3">
        <sup>3</sup>Department of Materials Science and Engineering, Southern University of Science and Technology, Shenzhen 518055, Guangdong, China.</aff>
      <aff id="I4">
        <sup>4</sup>Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, Guangdong, China.</aff>
      <author-notes>
        <corresp id="cor1">Correspondence to: Prof. Xiangli Zhong, National-Provincial Laboratory of Special Function Thin Film Materials, School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, Hunan, China. E-mail: <email>xlzhong@xtu.edu.cn</email>; Prof. Gaokuo Zhong, Changsha Semiconductor Technology and Application Innovation Research Institute, College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha, Hunan, China. E-mail: <email>gkzhong@hnu.edu.cn</email></corresp>
        <fn fn-type="other">
          <p>
            <bold>Received:</bold> 24 Jun 2025 | <bold>First Decision:</bold> 27 Aug 2025 | <bold>Revised:</bold> 8 Sep 2025 | <bold>Accepted:</bold> 30 Sep 2025 | <bold>Published:</bold> 27 May 2026</p>
        </fn>
        <fn fn-type="other">
          <p>
            <bold>Academic Editor:</bold> Zibin Chen | <bold>Copy Editor:</bold> Ting-Ting Hu | <bold>Production Editor:</bold> Ting-Ting Hu</p>
        </fn>
      </author-notes>
      <pub-date pub-type="ppub">
        <year>2026</year>
      </pub-date>
      <pub-date pub-type="epub">
        <day>27</day>
        <month>5</month>
        <year>2026</year>
      </pub-date>
      <volume>6</volume>
	  <issue>3</issue>
      <elocation-id>2026070</elocation-id>
      <permissions>
        <copyright-statement>© The Author(s) 2026.</copyright-statement>
        <license xlink:href="https://creativecommons.org/licenses/by/4.0/">
          <license-p>© The Author(s) 2026. <bold>Open Access</bold> This article is licensed under a Creative Commons Attribution 4.0 International License (<uri xlink:href="https://creativecommons.org/licenses/by/4.0/">https://creativecommons.org/licenses/by/4.0/</uri>), which permits unrestricted use, sharing, adaptation, distribution and reproduction in any medium or format, for any purpose, even commercially, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.</license-p>
        </license>
      </permissions>
      <abstract>
        <p>Thin-film capacitors exhibit significant application potential owing to their rapid charge/discharge characteristics and high-power density. Individual engineering strategies can effectively enhance either breakdown strength (E<sub>bre</sub>) or polarization difference to improve energy storage performance. However, such enhancement typically leads to unilateral optimization of either energy density (W<sub>rec</sub>) or energy efficiency (η) and fails to achieve an optimal trade-off between these, resulting in limitation fundamentally constrains the simultaneous enhancement. In this work, we propose multi-level synergistic modulation strategy, realizing synchronous optimization of multiple parameters to achieve breakthrough in comprehensive energy storage performance. Taking classic BaTiO<sub>3</sub> ferroelectric as example, we implemented interface engineering strategy to simultaneously enhance the E<sub>bre</sub> and reduce remnant polarization. Combined with entropy optimization strategy, this approach further increased the E<sub>bre</sub> while significantly boosting saturation polarization. The developed BaTiO<sub>3</sub>/SrTiO<sub>3</sub>-BiFeO<sub>3</sub> superparaelectric film capacitor demonstrate exceptional energy storage performance, achieving ultrahigh η of 97.35% and high W<sub>rec</sub> of <InlineParagraph>40.60 J/cm<sup>3</sup>,</InlineParagraph> increasing to 133.56% and 492.72% comparing to the pure film. Moreover, the same system on flexible substrates shows comparable outstanding energy storage performance, with excellent operational stability across wide temperatures and under mechanical deformation. These results confirm the universality of strategy and pave the way for multifunctional flexible capacitors.</p>
      </abstract>
      <kwd-group>
        <kwd>Energy storage</kwd>
        <kwd>superlattice</kwd>
        <kwd>entropy engineering</kwd>
        <kwd>superparaelectrics</kwd>
        <kwd>ferroelectric film</kwd>
      </kwd-group>
    </article-meta>
  </front>
  <body>
    <sec id="sec1">
      <title>INTRODUCTION</title>
      <p>High-performance capacitors are critically application potential in pulsed power systems, hybrid electric vehicles, and advanced renewable energy storage due to their rapid charge-discharge capability and high-power density<sup>[<xref ref-type="bibr" rid="B1">1</xref>-<xref ref-type="bibr" rid="B4">4</xref>]</sup>. For capacitors, energy density (W<sub>rec</sub>) and energy efficiency (η) serve as critical metrics for evaluating their energy storage performance, reflecting the amount of energy that can be stored per unit volume<sup>[<xref ref-type="bibr" rid="B5">5</xref>]</sup>. Higher W<sub>rec</sub> and η indicate that the capacitor can store energy more efficiently within a limited volume and release more energy during charge-discharge cycles<sup>[<xref ref-type="bibr" rid="B5">5</xref>]</sup>. Typically, the W<sub>rec</sub> and η are quantitatively calculated through the following formulas<sup>[<xref ref-type="bibr" rid="B6">6</xref>]</sup>: <inline-formula><tex-math id="M1">$$ W_{r e c}=\int_{P_{r}}^{P_{s}} E_{b r e} d P $$</tex-math></inline-formula> and η = <italic>W<sub>rec</sub></italic>/<italic>W<sub>rec</sub></italic> + <italic>W<sub>loss</sub></italic>, where P<sub>s</sub>, P<sub>r</sub>, breakdown strength (E<sub>bre</sub>) and W<sub>loss</sub> represent saturation polarization, remnant polarization, E<sub>bre</sub>, and energy loss density, respectively. Thus, enhancing E<sub>bre</sub> and maximizing the ΔP (The difference between P<sub>s</sub> and P<sub>r</sub>) are effective strategies for achieving superior capacitor performance<sup>[<xref ref-type="bibr" rid="B7">7</xref>,<xref ref-type="bibr" rid="B8">8</xref>]</sup>. Among various dielectric film materials for capacitive energy storage, ferroelectric (FE) materials have proven to be one of the most promising candidates for high-performance capacitors due to their high E<sub>bre</sub>, large saturation polarization, and excellent fatigue resistance<sup>[<xref ref-type="bibr" rid="B9">9</xref>-<xref ref-type="bibr" rid="B12">12</xref>]</sup>. Although the large P<sub>r</sub> caused by hysteretic switching of large FE domains, results in low η, presenting a major challenge for enhancing energy storage performance<sup>[<xref ref-type="bibr" rid="B13">13</xref>,<xref ref-type="bibr" rid="B14">14</xref>]</sup>. Recent advances in interface engineering [such as integrating dielectric interlayers into FE films to construct multilayer or superlattice structure (SLs)] demonstrate improved ΔP and E<sub>bre</sub>, thereby boosting η<sup>[<xref ref-type="bibr" rid="B15">15</xref>-<xref ref-type="bibr" rid="B20">20</xref>]</sup>. In particular, capacitors incorporating linear dielectric SrTiO<sub>3</sub> (STO) with ultrahigh E<sub>bre</sub> and η, showing the most pronounced reduction in P<sub>r</sub>, as demonstrated in systems like BaTiO<sub>3</sub> (BTO)<sup>[<xref ref-type="bibr" rid="B16">16</xref>]</sup>, BiFeO<sub>3</sub> (BFO)<sup>[<xref ref-type="bibr" rid="B17">17</xref>]</sup>, Bi<sub>3.15</sub>Nd<sub>0.85</sub>Ti<sub>3</sub>O<sub>12</sub> (BNT)<sup>[<xref ref-type="bibr" rid="B18">18</xref>]</sup>, and (Pb, La)(Zr, Ti)O<sub>3</sub> (PLZT)<sup>[<xref ref-type="bibr" rid="B19">19</xref>,<xref ref-type="bibr" rid="B20">20</xref>]</sup>. Nevertheless, the non-polar characteristic of STO fundamentally precludes any enhancement of P<sub>s</sub> and makes it impossible to increase the W<sub>rec</sub> in capacitors, meaning individual engineering strategies exhibit inherent limitations in achieving a balanced improvement in both W<sub>rec</sub> and η. Therefore, a holistic strategy that synergistically optimizes multiple parameters is critically needed to achieve breakthroughs in comprehensive energy storage performance.</p>
      <p>Researchers have employed composite engineering, multi-scale engineering, and combinatorial engineering, to effectively modulate the composition, microstructure, and local structure of dielectric materials<sup>[<xref ref-type="bibr" rid="B21">21</xref>-<xref ref-type="bibr" rid="B23">23</xref>]</sup>. These approaches enable precise control over key properties such as E<sub>bre</sub>, P<sub>s</sub>, P<sub>r</sub> and thermal stability, demonstrating excellent tunability, versatility, and practicality<sup>[<xref ref-type="bibr" rid="B24">24</xref>-<xref ref-type="bibr" rid="B26">26</xref>]</sup>. Liu <italic>et al</italic>. achieved a reduced hysteresis and significantly enhanced E<sub>bre</sub> in (Pb<sub>0.875</sub>La<sub>0.05</sub>Sr<sub>0.05</sub>) (Zr<sub>0.695</sub>Ti<sub>0.005</sub>Sn<sub>0.3</sub>)O<sub>3</sub> multilayer ceramic capacitors through a combined compositional and structural optimization strategy, realizing an impressive ultrahigh W<sub>rec</sub> with high η<sup>[<xref ref-type="bibr" rid="B24">24</xref>]</sup>. Meanwhile, Ma <italic>et al</italic>. proposed a synergistic nano-micro engineering approach that not only improved the microstructural homogeneity of FE multilayer ceramics but also facilitated the transformation of FE domains into polar nanodomains, thereby enhancing relaxor behavior and energy storage performance<sup>[<xref ref-type="bibr" rid="B25">25</xref>]</sup>. For interface engineering primarily based on STO, the entropy optimization strategy is undoubtedly the most suitable synergistic approach. By incorporating multiple principal elements to form a configuration-entropy system, it simultaneously achieves grain refinement and enhanced relaxor behavior<sup>[<xref ref-type="bibr" rid="B27">27</xref>-<xref ref-type="bibr" rid="B33">33</xref>]</sup>. This strategy not only compensates for the inability of STO to improve P<sub>s</sub> but also significantly increases the E<sub>bre</sub>, thereby synergistically enhancing both W<sub>rec</sub> and η, which ultimately expected to achieve comprehensive energy storage performance enhancement. In this study, we proposed a multi-level synergistic modulation strategy involving interface engineering and entropy optimization, which enables effective multi-directional regulation to simultaneously enhance energy storage density and efficiency. Taking BTO as a model system, we designed and fabricated a BTO/STO-BFO superparaelectric (SPE) film capacitor by introducing STO interlayers and BFO solid-solution. The multiscale structural modulation substantially enhanced E<sub>bre</sub> and P<sub>s</sub> with reducing P<sub>r</sub>, reaching an ultra-high η of 97.35% and a high W<sub>rec</sub> of 40.60 J/cm<sup>3</sup>, which represents improvements of 133.56% and 492.72% comparing to the pure BTO film. Remarkably, the flexible capacitors base on same strategy exhibits excellent energy storage performance and stability under harsh thermal and mechanical bending conditions, establishing a promising platform for developing flexible capacitors with high energy storage capacity.</p>
    </sec>
    <sec id="sec2">
      <title>MATERIALS AND METHODS</title>
      <p>Sample Fabrication: The (111)-STO substrate and the flexible mica substrate thinned mechanically were placed into pulsed laser deposition system (HT-PLD, RP-HT-102 purchased from Shenzhen Arrayed Materials Co., Ltd. in China) for the following thin films growth, to construct BTO-based capacitors (including BTO, BTO/STO and BTO/STO-BFO). In pulsed laser deposition (PLD) chamber in BTO-based capacitors on (111)-STO substrate, the bottom electrode layer of SrRuO<sub>3</sub> (SRO) was first grown on (111)-STO substrate using a KrF excimer laser (λ = 248 nm, Coherent) operated at 690 °C and 80 mTorr oxygen pressure. Then, through the rapid switching mode of multi-target by PLD, the alternating stacks of BTO and STO layers and the solid-solution of BFO were deposited under an oxygen pressure of 5 mTorr at 690 °C. During the deposition process, the fixed total excitation number was 15,000, and the cycle period was 50 times. Among them, the excitation number ratio of BTO, STO and BFO was 12:2:1. For flexible BTO-based capacitors, to weaken the van der Waals forces on the surface of the mica substrate, a CFO (CoFe<sub>2</sub>O<sub>4</sub>) film was deposited as a buffer layer before the bottom electrode layer SRO, with an oxygen pressure of 50 mTorr and 600 °C. The CFO, SRO and BTO/STO-BFO layers were grown at a pulse repetition rate of 10 Hz under laser energy of 330, 370 and 350 mJ, respectively. To construct the capacitor structure, a small ion sputterer (SBC-12, purchased from Beijing KYKY Co., Ltd. in China) was used to deposit a circular Au top electrode with a diameter of 100 μm. The detailed growth parameters and the design of the functional layer structure are provided in <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Tables 1 and 2</inline-supplementary-material>.</p>
      <p>Characterization and electrical Properties: The crystalline structure of the BTO-based capacitors were characterized by using XRD (Bruker/AXS D8-ADVANCE ECO diffractometer). The reciprocal space mapping (RSM) data were performed via Rigaku Smartlab diffractometer. The cross-sectional sectional transmission electron microscopy (STEM) specimens were lift-out by Focused Ion beam (FIB, Thermal Fisher Helios G4). STEM images were obtained through an aberration-corrected JEM-ARM300FS equipped with Energy-dispersive X-ray spectroscopy (EDS) detectors. The P-E hysteresis loops and I-E curves were measured using a Radiant Technology Precision Premium II tester (Radiant Technologies, Inc.) at a frequency of 10 kHz. For the bending test, the mold with different bending radii were used to adhere sample on its surface, and the bending performances of sample were tested.</p>
    </sec>
    <sec id="sec3">
      <title>RESULTS AND DISCUSSION</title>
      <p>The schematic diagram of our ideal design concept is illustrated in <xref ref-type="fig" rid="fig1">Figure 1A</xref>-<xref ref-type="fig" rid="fig1">C</xref>. By employing a multi-level synergistic modulation strategy involving interface engineering and entropy optimization, we achieve a transition from FE to relaxor ferroelectric (RFE), ultimately reaching a SPE state. In conventional FE oxides, the domain structure typically exhibits long-range order with large grain sizes, making a relatively large polarization intensity in macroscopic properties [<xref ref-type="fig" rid="fig1">Figure 1A</xref>]. While this leads to large hysteresis, small W<sub>rec</sub>, and low η, which limit their practical applications in energy storage<sup>[<xref ref-type="bibr" rid="B7">7</xref>]</sup>. Typically, introducing a linear dielectric material with high η and E<sub>bre</sub> as a blocking layer to form a FE/dielectric SLs. This approach can effectively disrupt long-range FE ordering and reduce grain size [<xref ref-type="fig" rid="fig1">Figure 1B</xref>], thereby diminishing P<sub>r</sub> and hysteresis while enhancing the E<sub>bre</sub>, resulting in increasing the W<sub>rec</sub> and η. Nevertheless, the limited P<sub>s</sub> and the existing hysteresis remain challenges. To overcome these limitations, we further integrate an entropy optimization strategy with the FE/dielectric SLs. This methodology enables simultaneous grain size refinement and enhancement of local polarization intensity, facilitating the transition from RFE to SPE and increasing comprehensive energy storage performance of the capacitor in <xref ref-type="fig" rid="fig1">Figure 1C</xref>. The developed dielectric capacitor shows great potential for next-generation energy storage applications, offering simultaneous achievement of ultra-high η and outstanding W<sub>rec</sub>. To validate our design strategy, we selected the well-established BTO FE system [<xref ref-type="fig" rid="fig1">Figure 1D</xref>]. By utilizing STO, a linear dielectric with a compatible crystal structure and lattice matching, we constructed BTO/STO SLs [<xref ref-type="fig" rid="fig1">Figure 1E</xref>] to enhance the E<sub>bre</sub> and η. We have previously established the efficacy of this strategy through systematic studies of BNT-STO and PLZT-STO system<sup>[<xref ref-type="bibr" rid="B18">18</xref>,<xref ref-type="bibr" rid="B20">20</xref>]</sup>. Furthermore, we incorporated a solid-solution BFO FE with known for high polarization intensity into the BTO/STO SLs [<xref ref-type="fig" rid="fig1">Figure 1F</xref>] to simultaneously boost both the P<sub>s</sub> and E<sub>bre</sub>, achieving significant improvement in energy storage performance. Using PLD with a multi-target rapid switching, we epitaxially grew BTO, BTO/STO SLs, and BTO/STO-BFO SPE films on (111)-oriented STO/SRO substrates, and the Au top electrodes were sputtered to construct capacitors. Additional experimental details can be found in the MATERIALS AND METHODS.</p>
      <fig id="fig1" position="float">
        <label>Figure 1</label>
        <caption>
          <p>Design concept and preparation of SPE film capacitor. (A-C) Micro-structure and macro-property of (A) FE, (B) RFE and (C) SPE by interface engineering and entropy optimization; (D-F) Schematic diagram of crystal structure for (D) BTO, (E) BTO/STO SLs and (F) BTO/STO-BFO SPE films. FE: Ferroelectric; RFE: relaxor ferroelectric; SPE: superparaelectric; BTO: barium titanate; STO: strontium titanate; BFO: bismuth ferrite; SLs: superlattices; P<sub>s</sub>: saturation polarization; P<sub>r</sub>: remanent polarization; E<sub>b</sub>: electric breakdown strength; W<sub>rec</sub>: recoverable energy density; W<sub>loss</sub>: energy loss.</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures5091.fig.1.jpg" />
      </fig>
      <p>The X-ray diffraction pattern (XRD) of the BTO films is presented in <xref ref-type="fig" rid="fig2">Figure 2A</xref>, where (iii) reflections from BTO (i = 1, 2) indicate the preferential growth along [111]- orientation, confirming growth without any secondary phase. Furthermore, the BTO/STO SLs and BTO/STO-BFO SPE films exhibit (111) main peak (labeled as “0”) accompanied by characteristic satellite peaks (labeled as ±1, ±2, ...), unambiguously verifying the formation of a periodic BTO/STO SLs. Notably, the BTO diffraction peak exhibits a small-angle shift following BFO incorporation, which we attribute to BFO-induced out-of-plane lattice expansion of the SLs to accommodate the compressive strain from the STO substrate<sup>[<xref ref-type="bibr" rid="B34">34</xref>]</sup>. This observation was further confirmed by RSM around the (222) reflection, as shown in <xref ref-type="fig" rid="fig2">Figure 2B</xref>-<xref ref-type="fig" rid="fig2">D</xref>. For the BTO film, the RSM pattern sequentially displays diffraction peaks from the STO substrate, SRO buffer layer, and BTO film from top to bottom in <xref ref-type="fig" rid="fig2">Figure 2B</xref>, confirming the highly epitaxial single-crystalline nature of the BTO film without any secondary phases or randomly oriented grains. After introducing STO, distinct satellite peaks emerged in the RSM image [<xref ref-type="fig" rid="fig2">Figure 2C</xref>] in addition to the STO, SRO, and BTO diffraction peaks (the absence of the SL(-2) reflection in <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 1</inline-supplementary-material> is attributed to its relatively weak intensity), further demonstrating the formation of a high-quality and regularly arranged SLs composed of BTO and STO. We observed upward and leftward shifts in the Q<sub>Z</sub> and Q<sub>X</sub> values of the main BTO diffraction peak respectively, indicating that the BTO layer in the superlattice is constrained by the STO layer, resulting in in-plane compressive strain and out-of-plane tensile strain. This is caused by the lattice mismatch between the STO layer (~3.905 Å) and the BTO layer (~3.992 Å). After the introduction of BFO to form the BTO/STO-BFO structure, the mutual dissolution of BTO and BFO weakened the diffraction intensity of the superlattice, leading to a reduction on satellite peaks in <xref ref-type="fig" rid="fig2">Figure 2D</xref>. Additionally, the rightward shift of the main BTO diffraction peak in Q<sub>X</sub> indicates that the strain state of the thin film transitioned to stronger in-plane compressive strain. This is because the incorporation of BFO reduced the overall average lattice constant and increased the lattice mismatch. Importantly, these results are consistent with the XRD observations, where the main BTO diffraction peak first shifted to higher angles with STO insertion and remained unchanged after BFO incorporation in <xref ref-type="fig" rid="fig2">Figure 2A</xref>. To further characterize the microstructure of the BTO/STO-BFO SPE film, we performed cross-STEM analysis [<xref ref-type="fig" rid="fig2">Figure 2E</xref>]. The STEM images reveal sharp interfaces between the STO substrate, SRO bottom electrode layer and BTO/STO-BFO functional layer. Among them, the thicknesses of the SRO and the BTO/STO-BFO layers are approximately 17 and 475 nm respectively, and each element is uniformly distributed without diffusion in the corresponding functional layer [<inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 2</inline-supplementary-material>]. Most significantly, the BTO/STO-BFO layer exhibits pronounced SLs ordering in the STEM image. To verify the compositional modulation of the SLs, we performed localized elemental analysis on a selected region of the BTO/STO-BFO layer [<xref ref-type="fig" rid="fig2">Figure 2F</xref>]. EDS mapping revealed the uniform distribution of Ba and Sr elements in the BTO and STO layers, with a thickness ratio of approximately 3:1. It is worth emphasizing that this thickness ratio was optimized and determined through systematic experimental studies in our previous work<sup>[<xref ref-type="bibr" rid="B18">18</xref>,<xref ref-type="bibr" rid="B20">20</xref>]</sup>. Moreover, line-scan analysis along the marked region (positions 1 → 2 in <xref ref-type="fig" rid="fig2">Figure 2F</xref>) demonstrates strict spatial confinement of Ba and Sr to their respective BTO and STO layers in <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 3</inline-supplementary-material>, proving that the SLs is formed by the stacking of BTO and STO layers, corresponding to the previous XRD and RSM results. In addition, Bi and Fe elements are uniformly distributed in small amounts throughout the superlattice [<inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 4</inline-supplementary-material>]. The BTO/STO SLs and the solid solution of BFO are further examined by high-resolution STEM observations along the [110] axis in <xref ref-type="fig" rid="fig2">Figure 2G</xref>. The Ba and Sr elements successively occupied the A position in the crystal structure in EDS images, while the Ti element mainly occupied the B position, revealing atomically sharp interface with heteroepitaxial relationships of BTO[111]-STO[111]. Furthermore, the presence of Bi and Fe elements also demonstrates the successful solid-solution of BFO into the BTO/STO superlattice results. This was achieved by bombarding the BFO target in a multi-target rapid switching mode, and thus it is randomly and uniformly solid-solution distributed in the atoms. These comprehensive microstructural analyses confirm the successful fabrication of [111]-oriented BTO/STO-BFO SPE film with precisely controlled compositional modulation, wherein STO and BFO respectively exist in a layered structure and a solid solution form, fully consistent with our proposed design strategy in <xref ref-type="fig" rid="fig1">Figure 1</xref>.</p>
      <fig id="fig2" position="float" pdfpage="5">
        <label>Figure 2</label>
        <caption>
          <p>The microstructure of BTO/STO-BFO SPE film on (111)-STO substrate. (A) The XRD of BTO, BTO/STO SLs and BTO/STO-BFO SPE films; (B-D) The RSM of (B) BTO, (C) BTO/STO SLs and (D) BTO/STO-BFO SPE films around the (222) reflections; (E) The STEM image and EDS of the BTO/STO-BFO SPE film; (F) The STEM image of BTO/STO SLs with the corresponding EDS element mapping; (G) The high-resolution STEM image of BTO/STO-BFO SPE film with the corresponding EDS element mapping. BTO: Barium titanate; STO: strontium titanate; BFO: bismuth ferrite; SLs: superlattices; SPE: superparaelectric; XRD: X-ray diffraction; RSM: reciprocal space mapping; STEM: scanning transmission electron microscopy; EDS: energy-dispersive X-ray spectroscopy.</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures5091.fig.2.jpg" />
      </fig>
      <p>To verify the energy storage performance of BTO/STO-BFO SPE film, the polarization-electric field (P-E) loops of BTO, BTO/STO SLs and BTO/STO-BFO SPE films are measured under the same electric field (E = 0.63 MV/cm), as shown in <xref ref-type="fig" rid="fig3">Figure 3A</xref>. Notably, <xref ref-type="fig" rid="fig3">Figure 3A</xref> was achieved by optimizing the growth parameters for STO and BFO [<inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figures 5-7</inline-supplementary-material>]. From the figure, the P-E loop of the BTO thin film capacitor exhibits a classic FE hysteresis, with P<sub>s</sub> and P<sub>r</sub> of 21.47 and 5.76 μC/cm<sup>2</sup>, respectively. When the STO layer was introduced into BTO, the resulting BTO/STO SLs exhibited a slenderer loop shape with significantly suppressed hysteresis at room temperature<sup>[<xref ref-type="bibr" rid="B16">16</xref>]</sup>. After incorporating highly polarization BFO, the polarization of the BTO/STO-BFO SPE film exhibited a marked enhancement. Meanwhile, the current- electric field (I-E) curves of all thin films exhibit double switching peaks corresponding to FE hysteresis behavior, confirming its characteristic FE properties. Especially, the BTO/STO-BFO SPE film demonstrates lower current. Subsequently, we measured the P-E hysteresis loops of the films at their maximum E<sub>bre</sub> in <xref ref-type="fig" rid="fig3">Figure 3B</xref>. Remarkably, through the combined strategy of STO layer insertion and BFO solid-solution incorporation, the BTO/STO-BFO film achieved a 330.48% improvement in E<sub>bre</sub>, increasing from 1.05 to 3.47 MV/cm. Moreover, the hysteresis loop showed significant contraction by an approximately two-fold enhancement in P<sub>s</sub> (increased from 25.29 to 46.52 μC/cm<sup>2</sup>), while the P<sub>r</sub> decreased from 5.67 to 2.09 μC/cm<sup>2</sup>. To further analyze the electric-field-driven electrical properties of the BTO/STO-BFO SPE film, we systematically measured P-E loops under varying E [<xref ref-type="fig" rid="fig3">Figure 3C</xref>]. We observed that the hysteresis loop gradually transitions from FE to RFE in low E, and eventually becomes a SPE state at high E, arising from the combined effects of the STO layer and BFO solid-solution. The field-dependent energy storage performance confirms our result [<xref ref-type="fig" rid="fig3">Figure 3D</xref>]. The BTO/STO-BFO SPE film exhibits FE behavior with a relatively low η below 2.11 MV/cm. When the E exceeds this critical threshold, η increases sharply as the film transitions to RFE. Ultimately at 3.47 MV/cm, the film achieves SPE while reaching both high W<sub>rec</sub> (40.60 J/cm<sup>3</sup>) and exceptional η (97.35%), corresponding to 492.72% and 133.56% increases compared to pure BTO film. The key performance metrics of the BTO, BTO/STO and BTO/STO-BFO films are shown in <xref ref-type="table" rid="t1">Table 1</xref>.</p>
      <fig id="fig3" position="float">
        <label>Figure 3</label>
        <caption>
          <p>The energy storage performance of BTO/STO-BFO SPE film on (111)-STO substrate. (A) The P-E loops of BTO, BTO/STO SLs and BTO/STO-BFO SPE films under the same electric field, and the inset shows the corresponding I-E curves; (B) The P-E loops of BTO, BTO/STO SLs and BTO/STO-BFO SPE films under the E<sub>bre</sub>; (C) The P-E loops of BTO/STO-BFO SPE film under different E; (D) The W<sub>rec</sub> and η of BTO, BTO/STO SLs and BTO/STO-BFO SPE films with different E; (E) Comparison of W<sub>rec</sub> and η with those reported in literatures. BTO: Barium titanate; STO: strontium titanate; BFO: bismuth ferrite; SLs: superlattices; SPE: superparaelectric; P-E: polarization-electric field; I-E: current-electric field; E: electric field; E<sub>bre</sub>: electric breakdown strength; W<sub>rec</sub>: recoverable energy density; η: energy storage efficiency; BNT: Ba1−xNi<sub>x</sub>TiO<sub>3</sub>; BZTS: BaZr<sub>0.2</sub>Ti<sub>0.8</sub>O<sub>3</sub>-2%Sm<sub>2</sub>O<sub>3</sub>; BLF: Bi<sub>0.993</sub>La<sub>0.007</sub>FeO<sub>3</sub>; CMBST: (Ce, Mn) co-doped Ba<sub>0.6</sub>Sr<sub>0.4</sub>TiO<sub>3</sub>; BSO: BiScO<sub>3</sub>; BMT: Bi(Mg, Ti)O<sub>3</sub>; BZT: barium zirconate titanate; BCT: barium calcium titanate; BTO-BFO: barium titanate-bismuth ferrite; BST: barium strontium titanate; BTO-BST: barium titanate-barium strontium titanate.</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures5091.fig.3.jpg" />
      </fig>
      <table-wrap id="t1">
        <label>Table 1</label>
        <caption>
          <p>Key performance metrics of the film capacitor</p>
        </caption>
        <table frame="hsides" rules="groups">
          <thead>
            <tr>
              <td style="border-bottom:1;">
                <bold>Film capacitor</bold>
              </td>
              <td style="border-bottom:1;">
                <bold>E<sub>bre</sub></bold>
                <break />
                <bold>(MV/cm)</bold>
              </td>
              <td style="border-bottom:1;">
                <bold>P<sub>s</sub></bold>
                <break />
                <bold>(μC/cm<sup>2</sup>)</bold>
              </td>
              <td style="border-bottom:1;">
                <bold>P<sub>r</sub></bold>
                <break />
                <bold>(μC/cm<sup>2</sup>)</bold>
              </td>
              <td style="border-bottom:1;">
                <bold>W<sub>rec</sub></bold>
                <break />
                <bold>(J/cm<sup>3</sup>)</bold>
              </td>
              <td style="border-bottom:1;">
                <bold>η</bold>
                <break />
                <bold>(%)</bold>
              </td>
            </tr>
          </thead>
          <tbody>
            <tr>
              <td>BTO</td>
              <td>1.05</td>
              <td>25.29</td>
              <td>5.67</td>
              <td>8.24</td>
              <td>72.89</td>
            </tr>
            <tr>
              <td>BTO/STO</td>
              <td>1.47</td>
              <td>23.33</td>
              <td>2.37</td>
              <td>11.60</td>
              <td>91.44</td>
            </tr>
            <tr>
              <td>BTO/STO-BFO</td>
              <td>3.47</td>
              <td>46.52</td>
              <td>2.09</td>
              <td>40.60</td>
              <td>97.35</td>
            </tr>
          </tbody>
        </table>
        <table-wrap-foot>
          <fn>
            <p>BTO: Barium titanate; STO: strontium titanate; BFO: bismuth ferrite; E<sub>bre</sub>: electric breakdown strength; Ps: saturation polarization; Pr: remanent polarization; W<sub>rec</sub>: recoverable energy density; η: energy storage efficiency.</p>
          </fn>
        </table-wrap-foot>
      </table-wrap>
      <p>This simultaneous enhancement of W<sub>rec</sub> and η in BTO/STO-BFO SPE film originate from two aspects. On the one hand, the synergistic effect between periodic STO layers and BFO solid solution elevates the breakdown barrier and suppresses conductive path formation, thereby significantly improving E<sub>bre</sub>. The other hand, the disrupted long-range ordering facilitates the transformation of nanodomains into highly polarized configurations, effectively increasing the ΔP<sup>[<xref ref-type="bibr" rid="B35">35</xref>,<xref ref-type="bibr" rid="B36">36</xref>]</sup>. Moreover, the well-maintained P-E loops among 25-150 °C in <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 8</inline-supplementary-material> suggests that the film can work at a broad temperature range. To highlight the advantages of our approach over individual engineering strategies, W<sub>rec</sub> and η for BTO-based materials reported in literatures<sup>[<xref ref-type="bibr" rid="B31">31</xref>,<xref ref-type="bibr" rid="B37">37</xref>-<xref ref-type="bibr" rid="B57">57</xref>]</sup> are presented in <xref ref-type="fig" rid="fig3">Figure 3E</xref>, and our BTO/STO-BFO SPE film clearly stands out with orders of magnitude ultrahigh η, demonstrating exceptional potential for practical capacitor applications.</p>
      <p>To extend our work toward broader applications, we extended the design strategy to flexible mica substrate and successfully fabricated flexible BTO/STO-BFO SPE film. Notably, an additional CFO buffer layer was introduced between the mica and the functional layers to address the significant structural mismatch and chemical incompatibility between mica and the FE films. As evidenced by the P-E loops with different E in <xref ref-type="fig" rid="fig4">Figure 4A</xref>, the flexible BTO/STO-BFO SPE film maintain polarization intensities comparable to those on STO substrate. Moreover, the local grey area reveals significant contraction of the hysteresis loop with increasing E, which is consistent with the P-E loops observed in films grown on STO substrates. More importantly, the transition from FE to RFE to SPE is a stable and reversible process [<inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 9</inline-supplementary-material>], which can be repeatedly achieved by alternating the application of low and high E<sub>bre</sub>. Consequently, flexible BTO/STO-BFO SPE film still achieve impressive performance metrics of 34.37 J/cm<sup>3</sup> and 97.48% at 2.74 MV/cm [<xref ref-type="fig" rid="fig4">Figure 4B</xref>], though the slightly inferior structural/thermal stability of mica substrate results in a reduced E<sub>bre</sub>. The flexible BTO/STO-BFO SPE film demonstrated excellent energy storage stability under harsh environmental conditions, as verified through high-temperature, bending radius, and bending cycle experiments. Within the temperature range of 25 to 180 °C, the P-E loops, P<sub>s</sub> and P<sub>r</sub> remain nearly unchanged in <xref ref-type="fig" rid="fig4">Figure 4C</xref> and <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 10A</inline-supplementary-material>. The W<sub>rec</sub> and η have remained stable at 29.26 ± <InlineParagraph>1.04 J/cm<sup>3</sup></InlineParagraph> and 96.86% ± 0.92% respectively, and its change rates are both less than 5% [<xref ref-type="fig" rid="fig4">Figure 4D</xref>], demonstrating the outstanding high-temperature stability of the flexible BTO/STO-BFO SPE film over a broad temperature range. Similarly, <xref ref-type="fig" rid="fig4">Figure 4E</xref> and <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 10B</inline-supplementary-material> shows the excellent electrical stability in flexible BTO/STO-BFO SPE film under bending conditions (R = 10 to 4 mm). The energy storage performance reached its minimum at R = 6 mm, with W<sub>rec</sub> and η of 28.56 J/cm<sup>3</sup> and 95.51% respectively [<xref ref-type="fig" rid="fig4">Figure 4F</xref>]. We further conducted repeated bending tests [<xref ref-type="fig" rid="fig4">Figure 4G</xref>], and it is observed that the P<sub>s</sub>, P<sub>r</sub> and ΔP of P-E loops after 300, 400, 500 and 1,000 bending cycles are quite stable as well in <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figure 10C</inline-supplementary-material>. Meanwhile, the energy storage performance remained robust, with W<sub>rec</sub> and η consistently maintained around 29.03 J/cm<sup>3</sup> and 96.20%, exhibiting minimal variations of only 1.62% and 0.73% [<xref ref-type="fig" rid="fig4">Figure 4H</xref>]. Additionally, SEM images and EDS of the film after 1,000 bending cycles [<inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Figures 11 and 12</inline-supplementary-material>] confirmed that its microstructure remained intact with excellent homogeneity. These results demonstrate that the flexible BTO/STO-BFO SPE film simultaneously possess outstanding thermal stability and robust mechanical flexibility, exhibiting significant potential for flexible energy storage device applications.</p>
      <fig id="fig4" position="float">
        <label>Figure 4</label>
        <caption>
          <p>The energy storage performance of flexible BTO/STO-BFO SPE film on mica substrate. (A) The P-E loops of flexible BTO/STO-BFO SPE film under different E, and the local grey area have been magnified; (B) The W<sub>rec</sub> and η of flexible BTO/STO-BFO SPE film with different E; (C-H) The P-E loops and energy storage performance of flexible BTO/STO-BFO SPE film under (C and D) different temperature, (E and F) bending radii and (G and H) bending cycle. BTO: Barium titanate; STO: strontium titanate; BFO: bismuth ferrite; SPE: superparaelectric; P-E: polarization-electric field; E: electric field; W<sub>rec</sub>: recoverable energy density; η: energy storage efficiency.</p>
        </caption>
        <graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="microstructures5091.fig.4.jpg" />
      </fig>
    </sec>
    <sec id="sec4">
      <title>CONCLUSIONS</title>
      <p>In summary, we propose a multi-level synergistic modulation strategy combining interface engineering of the STO layer and entropy optimization via BFO solid-solution, achieved simultaneous enhancement of breakdown field strength and saturation polarization while effectively suppressing hysteresis loss, leading to dramatically improved energy storage performance. The optimized BTO/STO-BFO SPE film capacitors demonstrate an ultrahigh η of 97.35% and a remarkable W<sub>rec</sub> of 40.60 J/cm<sup>3</sup>, representing 133.56% and 492.72% improvements respectively over pure BTO film. Furthermore, the flexible capacitors designed based on this strategy maintain excellent energy storage performance with high stability across wide temperature ranges and under various severe bending deformations, verifying the universality of our multi-level cooperative regulation strategy. This work provides a promising solution for the coordinated optimization of multiple parameters and comprehensive enhancement of energy storage performance in film capacitor.</p>
    </sec>
  </body>
  <back>
    <sec>
      <title>DECLARATIONS</title>
      <sec>
        <title>Authors’ contributions</title>
        <p>Conception and coordination of the project: Zhong, X. L.; Zhong, G.;</p>
        <p>Sample fabrication: Chen, Q.; Su, P.;</p>
        <p>Supervision of sample fabrication: Zhong, X.; Wang, J.; Li, J.; Zhong, G.;</p>
        <p>Structure analysis and interpretation: Chen, Q.; Cheng, M.; Song, H.;</p>
        <p>Writing the manuscript: Chen, Q.; Zhong, X.; Zhong, G.;</p>
        <p>All authors participated in discussions and analysis.</p>
      </sec>
      <sec>
        <title>Availability of data and materials</title>
        <p>Some results of supporting the study are presented in the <inline-supplementary-material content-type="local-data" mimetype="application/pdf" xlink:href="microstructures5091-SupplementaryMaterials.pdf">Supplementary Materials</inline-supplementary-material>.</p>
      </sec>
      <sec>
        <title>AI and AI-assisted tools statement</title>
        <p>Not applicable.</p>
      </sec>
      <sec>
	  <title>Financial support and sponsorship</title>
        <p>This work was supported by National Key Research and Development Program of China (2022YFF0706100 and 2024YFA1410600), National Natural Science Foundation of China (No. 62474186, 12275230 and 52472139), Shenzhen Science and Technology Program (JCYJ20240813155702004), Postgraduate Scientific Research Innovation Project of Hunan Province (No. CX20230654), and Project of Yuelushan Center for Industrial Innovation (Grant No. 2025YCII0224).</p>
      </sec>
      <sec>
        <title>Conflicts of interest</title>
        <p>Li, J. is a Senior Editorial Board Member of <italic>Microstructures</italic>. Li, J. was not involved in any steps of editorial processing, notably including reviewers' selection, manuscript handling, and decision making. The other authors declare that there are no conflicts of interest.</p>
      </sec>
      <sec>
        <title>Ethical approval and consent to participate</title>
        <p>Not applicable.</p>
      </sec>
      <sec>
        <title>Consent for publication</title>
        <p>Not applicable.</p>
      </sec>
      <sec>
    <title>Copyright</title>
    <p>&#x00A9; The Author(s) 2026.</p>
      </sec>
      <sec sec-type="supplementary-material">
      <title>Supplementary Materials</title>
          <supplementary-material content-type="local-data">
                <media xlink:href="microstructures5091-SupplementaryMaterials.pdf" mimetype="application/pdf">
                        <caption>
                                <p>Supplementary Materials</p>
                        </caption>
                </media>
          </supplementary-material>
          </sec>
		  </sec>
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